Abstract
Recent formulations of the ALCHEMI technique have explicitly accounted for ionization delocalization of an element i with a single linear parameter Li,- that represents the extent of localization. The x-ray emission of a spectral line characteristic of the element is assumed to be proportional to a linear combination of the thickness-averaged electron intensity at (1) the site of the atom (fraction: Li) and (2) averaged over the unit cell (fraction:1 - Li)). The parameter Li is assumed to be characteristic of the elemental shell and independent of the diffracting conditions. In consequence of these assumptions, it has been shown that ionization delocalization correction can be performed in conjunction with "statistical" ALCHEMI by correcting only the extracted correlation coefficients.The parameter γiξ / Ii(0) is defined to be the ratio of the characteristic intensity (I) of element i at a crystal orientation (ξ) to its characteristic intensity at a reference orientation (0), which is ideally free of electron channeling effects.
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