Abstract
The effect of ion radius on the structural and electrical properties of the perovskite oxide Ba1-x SrxTiO3 thin film is investigated in this work. X-ray diffraction analysis confirmed the formation of phase perovskite structures. Investigations of ceramic microstructures and mechanical properties showed their dependence on the value of ratio x. X-ray diffraction (XRD) and Field emission scanning electron microscopy (FESEM) are used to study the crystallographic aspects of the materials. The XRD pattern changed from tetragonal to cubic as x rose. FESEM images revealed the particle size varied with the values of x increased. The results show that as the ion radius varies, the crystal structure undergoes distortions, affecting the symmetry and stability of the BaSrTiO3 thin films. Electrical properties change depending on the change in particle size.
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