Abstract

Abstract The effect of electron scavenger (SF6) on the radiolysis products of N2O was examined. The sensitization of N2O by various rare gases was also measured. In the presence of an electron scavenger we got 3.0 for the value of −ΔG(−N2O) in good agreement with the value of G(e−) for N2O. In the experiments of Xe or Kr containing small amounts of N2O, the G(−N2O) values were nearly equal to the respective G(e−) values for the rare gases, and the addition of SF6to the Xe-N2O system almost completely inhibited nitrogen formation. The results show that one electron decomposes just one molecule of N2O. This fact can not be accounted for by the hitherto assumed mechanism, and a new mechanism involving N2O− is proposed for ionic processes in the radiolysis of N2O. In the N2O-rare gas mixtures of various compositions, the sensitized yields of N2O decomposition per 100 eV energy absorbed by rare gases were divided into two groups, e.g., the yields from He, Ne mixtures were about twice as large as those from Ar, Kr and Xe mixtures. This result is discussed in terms of charge transfer and the Penning ionization.

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