Abstract
In this work, we have studied electrical conductivity and dielectric properties of polycrystalline La2−xYxMo2O9 (0.05 ≤ x ≤ 0.3) compounds in the temperature range from 358 K to 1088 K and the frequency range from 10 Hz to 3 GHz. The bulk and grain boundary contributions to the overall conductivity of these compounds show Arrhenius type behavior at low temperatures. The random free-energy barrier model has been used to analyze the frequency dependence of the conductivity. The charge carrier relaxation time and its activation energy have been determined from the analysis of the conductivity spectra using this model. The results obtained from the random free-energy barrier model satisfy Barton-Nakajima-Namikawa relation. The conduction mechanism has been also predicted using random free-energy barrier model and the scaling formalism. We have observed that the dielectric relaxation peaks arise from the diffusion of oxygen ions via vacancies.
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