Abstract
The amorphization of two GeO 2 polymorphs, the hexagonal ( P3 2 21) and tetragonal forms ( P4 2 /mnm), were studied using 1.5 MeV Xe +. The polymorphs showed significant differences in their susceptibility to amorphization by irradiation. Hexagonal GeO 2 had a lower amorphization dose (1.7×10 13 ions/cm 2 at room temperature), higher critical temperature (876 K) and higher activation energy for dynamic annealing (0.2 eV) than tetragonal GeO 2 which had a higher amorphization dose (1×10 15 ions/cm 2 at room temperature), lower critical temperature (820 K) and lower activation energy (0.02 eV). Because of their identical composition, the difference in susceptibility to amorphization between the two GeO 2 polymorphs is attributed to the connectivity of polyhedra. The glass-forming ability of hexagonal GeO 2 is much greater than tetragonal GeO 2 because of the three dimensional network formed by corner sharing (GeO 4) tetrahedra. The radiation effects of two GeO 2 polymorphs are also compared to the results of irradiation study of two related materials, rutile (TiO 2) and quartz (SiO 2). Both chemical composition and structure contribute significantly to the susceptibility to irradiation-induced amorphization in these phases.
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