Abstract
ABSTRACTSingle crystal Ytrria-stabilized Zirconia was irradiated with Xe2+ and Xe3+ ions at 320 and 450 keV over a range of doses from 1013 to 1016 ions/cm2. Damage appears as a 150 nm surface layer with a dense dislocation network. The X-ray diffraction pattern shows an increasing lattice expansion with increasing dose that reaches a saturation point. Ion irradiation increases the surface conductance of the material; this effect is removed with certain post-treatments. Preliminary isotope depth profiling indicates enhanced ion diffusion in the damaged layer.
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