Abstract
Micro-particles deposited over membrane Nuclepore filters or other smooth surfaces are well suited to be analyzed by PIXE (particle induced X-ray emission) and by electron probe techniques. The effect of the size of micro-particles on a surface sample when analyzed by macro-PIXE [11] is discussed. To analyze individual particles (sizes, distribution, geometry, etc.) electron microscopy is the most accepted technique. A way to complement macro-PIXE and microscopy is described which presents some advantages over the sophisticated micro-PIXE systems. Secondary electron microscopy (SEM), electron micro-probe and optical microscopy were applied to aerosol and other similar samples. SEM micrographs served to define some physical properties of particles through a developing image processing program.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
