Abstract

The beam–solid interaction during high flux heavy-ion implantation has been studied by the in situ detection of photon emission. A spinel of MgO· n(Al 2O 3) with n=2.4 was irradiated with 60 keV Cu − at dose rates of 10, 50 or 100 μA/cm 2 to a dose of 1.5×10 17 ions/cm 2 . Under the implantation, photon emission ranging from 1.4 to 6.2 eV was detected by a time-resolved optical device based on a fast-response CCD (Princeton Instruments: IMAX-512). Emission lines of sputtered Mg, Al and Cu atoms were observed. A comparison of the dose and dose rate dependence of the Cu I line intensity from MgO· n(Al 2O 3) with those obtained for amorphous (a-)SiO 2 substrate revealed the good correlation of Cu I line intensity with nanoparticle formation detected by optical absorbance measurement.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.