Ion-induced electron emission from simple metals: Charge state effects

Abstract

Charge changing events of ions moving inside metals contribute significantly to the stopping power as well as to the electron emission at intermediate velocities v ≈ v 0 ( v 0, Bohr velocity). Their effect on the backward electron yield from Al bombarded by He ions is investigated here within the transport equation formalism. The excitation of target electrons by the moving ions and the generation of excited electrons by electron loss from different charged species (He +, He 0) are both taken into account. Excitation of projectile electrons by Auger processes and resonant-coherent electron loss from the projectile have been separately considered.