Abstract
The total electron emission yield γ of sputter-cleaned Al, Cu, Ag, W, and Au surfaces has been measured under bombardment with H +, H 2 +, H 3 +, He +, Ne +, and Ar + ions in the energy range from 80 keV to 1 MeV. The yield γ is found to be proportional to the electronic stopping power in the case of proton impact. Deviations from a strict proportionality are reported for the heavier ions. The yields induced by the molecular ions H 2 + and H 3 + are compared with the proton yields. It is found that the additional electron(s) of the molecular ions directly contribute to the secondary electron yield at the highest velocities of this experiment.
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