Abstract
Angular resolved investigations of Auger atomic lines induced by ion bombarment have been conducted on Si, Al and Al x Mg 1− x samples. It is confirmed, by direct experimental evidence, that the atomic-like Auger emission occurs outside the sample and new transitions are also observed. All main Auger atomic lines exibit large Doppler shifts which can be accounted by a simple binary collision model in which only excitation of primary recoils by violent asymmetric collisions are considered. Under normal Ar + ion incidence doubly excited L 2MM Auger peaks are observed for Al x Mg 1−x samples ( x = 0.25, 0.50, 0.75, 1.0), such peaks are absent in pure Al bombarded under the same conditions, indicating that such excitations are generated by asymmetric MgAl collisions. The results also show an enrichment of Al within the first layers for an Al 0.50Mg 0.50 sample as the bombarding energy is increased. This enrichment can be interpreted in terms of preferential sputtering and segregation effects.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
