Abstract
Methods for determining the refractive-index profile and mode spectrum of planar slab waveguides produced by ion-exchanged techniques are receiving increased attention. A general method of translating the experimentally determined ion-exchanged thin-film propagating mode spectrum into an analytical expression of the refractive-index profile is presented. It involves computer fitting by numerical integration of the exact WKB characteristic propagation mode equation to improve accuracy and preserve the distinction between TE and TM modes. The second-order polynomial refractive-index profile has been found to be well suited to planar thin films produced from soda-lime glass microscope slides in a silver-nitrate stirred dilute melt with sodium nitrate at 317°C - 1°C with fabrication times ranging from 0·5 to 36 min. The analysis was conducted with a view to ultimately fabricating self-imaging devices.
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