Abstract
Multilayer FeTi and NiTi samples were electrolytically charged with hydrogen to a concentration corresponding to TiH x ( x = 1.5−2.3) in titanium layers. The samples were then bombarded with xenon ions (Xe 2+) at 600 ke V to induce ion beam mixing. Rutherford backscattering and forward recoil spectroscopies were used to probe the changes in the metal and the hydrogen concentrations and profiles respectively. A fluence of 8 × 10 15 Xe 2+ cm −2 caused mixing of uncharged samples of FeTi and NiTi. In hydrogenated samples, however, the mixing was significantly retarded in the FeTi case, whereas NiTi was still completely mixed. This was found to correlate with the release of hydrogen during ion bombardment. The corresponding final hydrogen concentrations were one-half of the initial concentration in FeTi and one-third in NiTi.
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