Abstract

Ion beam technique using the T (d, α) n nuclear reaction was applied to depth profiling of tritium in a deuterium implanted titanium sample simulating nuclear fusion reactor materials. The energy distribution of the α-particles from the T (d, α) n reaction was converted to the depth profile of tritium. The impurities of D, 3He, C and O were found to give no significant influence on the depth profiling. From the backscattered deuteron spectrum measured the amounts of the impurity atoms of O and C were estimated. According to the present results the applicability of the ion beam techniques to depth profiling of tritium in nuclear fusion reactor materials is discussed.

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