Ion beam analysis of float glass surface composition

Abstract

Data are reported on ion beam surface analysis methods of proton-induced X-ray emission (PIXE), and helium-induced X-ray emission (HIXE), made simultaneously with Rutherford backscattering spectrometry (RBS), which were taken with samples from across the full width of a float glass production line. Data are given for both clear and green glass. Significant variations are recorded between signals from the lower surface, (the face in contact with tin), and the upper surface, not only for the uptake of the tin, but also for the consequent changes in the near surface composition of the other main elements of the glass. In particular, the tin alters the local compositions of iron, caalcium, silicon, and sodium. The changes are interpreted in terms of the furnace temperature gradients and chemical interactions. In all cases, including the green glass, iron is depleted from the non-tin face relative to the bulk composition, and the changes of surface content of the iron differs on the two faces relative to the bulk value.