Abstract

A new method is described of rendering ionized neutral van der Waals clusters. This involves the association of NO + ions to a neutral argon cluster beam in a Nier-type ion source. This new (and alternative to electron and photon) ionization mode appears to be softer than electron impact ionization (i.e. leading to less fragmentation) and measured cluster ion distributions exhibit the typical icosahedral shell and subshell closures (i.e. in the range from n = 13 to n = 55) which are not present in the case of electron impact ionization.

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