Abstract
The energy band alignment in thin-film and low-dimensional devices is extremely important. However, experimental determination or theoretical prediction of the energy level alignment has been difficult to realize, especially under typical operating conditions. Following a recent breakthrough in our group, where SKPM technique was employed to image the vacuum level profile across the depth direction of an operando organic PV device with a conventional stacking structure, here we present the vacuum level alignment measurement on an inverted structure OPV device. Previously, there had been conflicting reports on the built-in field and the device operation polarity. In this talk, we will present a comprehensive understanding of the energy level alignment in inverted structure OPVs, and how the measured parameters can be adopted in numerical modeling of the device physics.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.