(Invited) Understanding of Growth Kinetics of Thermal Oxides on 4H-SiC (0001) for Control of MOS Characteristics

Abstract

Control of thermal oxidation conditions is inevitable to achieve a high-quality MOS interface on SiC substrates. We investigated the kinetics and thermodynamics of 4H-SiC oxidation for nanometer-thick SiO2/SiC system, to find out thermodynamically preferred conditions for a smooth elimination of carbon byproduct from the interface. A linear regime of thermal oxidation of 4H-SiC (0001) was clearly observed with a high activation energy corresponding to direct CO ejection from the interface. Based on our understanding of oxidation kinetics, we found that nearly-ideal MOS characteristics with reduced interface state density ~1011 cm-2eV-1 or less, were achievable on 4H-SiC (0001) only by dry oxidation processes.