Abstract

Carrier localization, transportation and recombination in blue-emitting InGaN/GaN multiple quantum wells were analyzed using temperature-dependent photoluminescence spectroscopy, confocal laser scanning microscopy and time-resolved photoluminescence (TRPL). The temperature-dependent shift of PL intensity was fitted with Arrhenius equation and explained using two non-radiative channels, which are related with thermal activation of carriers from different confining potentials. The S-shaped shift of PL peak energy and inverse-S-shaped shift of PL full width at half maximum were explained with carrier localization and carrier transportation. The TRPL spectra taken at several different places from bright region to dark region in the confocal microscopic image showed that the fast decay lifetime τ1 increases with decreasing PL intensity, indicating a higher carrier transportation rate at bright region, while the slow decay lifetime τ2 decreases with decreasing PL intensity, indicating a higher probability of non-radiative recombination at dark region.

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