Abstract

Defect chemistry plays a major role in the operation of perovskites cells. On one hand they are behind the remarkable self-healing,[1] while on the other they dictate the level of traps, non-radiative recombination,[2] as well as promote ion migration.[3] Moreover, once ions reach the electrodes the device degradation is accelerated.[4, 5] Combining the various reports it seems that if the perovskite would not lose its constituents it would self-heal and if it do lose them it is game-over. We claim that ion migration into the blocking layer is the most important electrochemical process standing in the way of long-term stability. As we will show at the presentation, a significant part of the electrochemistry behind ion leakage and consequently electrode reactions, is captured by a semiconductor device model that accounts for mixed electronic-ionic conduction.[6] While the mere transport of ions introduces no device degradation, introducing oxidation/reduction reactions at the electrodes reproduces the effect of light & bias on device stability. Lastly, we’ll discuss if it is possible to design the device to mitigate this ion leakage out of the perovskite layer.

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