Abstract

The recent advancement of aberration-corrected transmission electron microscopy (TEM) and in situ techniques unlocks a door to a new era of discovery in materials science. It allows us to study the local structure, chemical composition, and electronic properties of nanostructures with the atomic resolution, and observe the dynamic evolution of materials in response to applied fields and to changes in environments in real-time. In this talk, I will present our work on the development of in-situTEM techniques for imaging electric polarization, probing the nucleation and growth of ferroelectric domains during electric polarization switching, and observing thedynamic reaction and structural evolution of heterogeneous functional materials under realistic conditions with atomic precisionthrough a MEMS-based, electron-transparent closed cell with a heating stage.

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