Abstract

Electroluminescence characteristics of metal-oxide-semiconductor tunnel diodes with a silicon nano-layer on silicon-on-insulator substrates have been studied. Peaks in the spectrum from the diode have been observed at ~1030 nm (~1.20 eV), ~950 nm (~1.31 eV), ~910 nm (~1.36 eV) and ~620 nm (~2.00 eV). It is suggested that the electroluminescence at ~620 nm is due to transitions between ultrathin silicon subbands.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.