(Invited, Digital Presentation) The Challenges of Overcoming Defects in GaN Hemts for Operation in Extreme Environments

Abstract

GaN high electron mobility transistors (HEMTs) are known to contain a high density of crystal defects. The material properties of GaN such as high breakdown voltage, carrier mobility, critical electric field strength, and higher thermal conductivity than Si, make it an ideal candidate material for use in power switches in extreme environments. In high power environments (>1.5kV), vertical GaN device geometry is emerging as an effective technique to improve performance, but the more mature lateral GaN HEMT technology is being consistently improved upon to increase breakdown voltage and overall performance in the high-power regime. In high temperature environments, GaNs wide bandgap helps in preventing unwanted thermal generation of carriers, but devices also experience increased gate-leakage current and ohmic contact resistance degradation at high temperatures. The role of defects in these limiting factors of GaN HEMT performance in extreme high power and high temperature environments is reviewed.