(Invited) Considerations in Sample Environment and Data Processing for Operando Cell Studies by Neutron Depth Profiling

Abstract

Neutron depth profiling (NDP) is a nominally non-destructive analytical technique used to measure select isotopes (6Li, 14N, 10B, etc...) in a diversity of materials. NDP can be conducted on operating Li-ion cells and be used to provide researchers real-time information about cell formation, conductance, and resilience. The increased use of NDP for electrochemical studies within the past decade has inspired the development of new sample preparation and data reduction strategies. Select topics that have been studied in the U.S. have included issues of neutron attenuation and scattering due to the addition of a protective capping layer over a cell, the possible need for matrix matched standards for complex materials, and the streamlining of the NDP data reduction procedure. Several challenges remain, however, including improving NDP data acquisition and reduction methods for detectable, low-Z isotopes such as 14N and 35Cl and improving upon the NDP data reduction and processing procedures so that they are more accessible to non-instrument specialists. All these topics will be discussed in this presentation.