Abstract
With the development of MCUs and the deterioration of the electromagnetic environment, it has led microcontroller unit (MCU) electromagnetic susceptibility (EMS) to transient burst interference to become the focus on academics and enterprises. Most electromagnetic compatibility (EMC) studies of MCUs have not taken into account the contrasting nature of differing architectures. Subsequently, different MCU architectures may possess varying physical parameters, often resulting in different susceptibility EMI outcomes. This paper shall focus on the relationship between MCU architectures and its EMC susceptibility. Upon close examination, test results have shown to exhibit variances in relation to the two types of MCU architectures with regards to susceptibility of electrical fast transients (EFT) burst. Consequently, the underlying reasons resulting in MCU susceptibility variations based on differing MCU architectures shall also be elaborated on further.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
