Abstract
The present study reported the temperature dependent properties of tin oxide (SnO2) thin films deposited by using conventional, cost effective and non-vacuum-based spray pyrolysis technique (SPT). The as deposited films were characterized by various characterization techniques such as X ray diffraction (XRD), UV-Vis spectroscopy and Scanning electron microscopy (SEM) to study their structural, optical and morphological properties respectively. XRD analysis revealed tetragonal rutile crystal structure of SnO2 with preferred orientation along (200) plane. The refinement of XRD data was also carried out by Rietveld refinement to obtain the fitting parameters, crystallite size and lattice parameters. UV-Vis study showed considerable change in optical absorbance and transmittance with change in substrate temperature. Effect of substrate temperature on film thickness, refractive index and band gap energy were determined by Swanepoel method and by Tauc’s plot respectively. The Urbach energy was also calculated and were correlated to the defects in SnO2 films. SEM micrograph showed the transformation from granules to nanospheres as a function of substrate temperature. Electrical properties were determined by Hall effect measurements which gives carrier concentration, electrical resistivity and mobility in the order of 1019-1020 /cm3, 10−2-10−3 Ω.cm and 4–23 cm2/Vs respectively.
Published Version
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