Abstract
CdSe polycrystalline thin films were grown onto glass substrates by chemical bath deposition at 70 °C. The samples were characterised by structural, optical and electrical properties. XRD results revealed that the deposited CdSe thin films are polycrystalline in nature with cubic structure having (1 1 1) plane as the preferred orientation. The structural parameters such as the lattice constant, crystallite size, dislocation density, number of crystallites per unit area and strain were calculated for films and it was found that the estimated structural parameters are better compared with those of vacuum based hot wall deposited CdSe thin films. EDAX results indicated that the prepared CdSe thin films are non-stoichiometric in composition (Cd 1.3Se 0.7). The optical analysis helped to establish the type of transition as direct allowed. Various optical parameters such as absorption coefficient, extinction coefficient and band gap energy have also been evaluated. The thickness dependence of structural and optical parameters has been discussed in this paper in detail. The high temperature conductivity mechanism has been found to be due to the grain boundary scattering contribution and the evaluated high temperature electrical parameters strongly confirm the semiconducting nature of CdSe thin films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.