Abstract

Pulsed laser deposition (PLD) technique (called also laser ablation) has been employed to grow magnesium oxide thin films on quartz wafers. The optical properties of MgO thin films were studied using temperature dependent photoluminescence measurements. The structural properties of the MgO thin films were carried out using X-ray method. A strong dependence of the films structure, the crystalline quality and the optical properties of investigated films caused by variation of substrate's temperature was observed.

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