Abstract
We performed local electrical transport measurement on single grains of a pentacene thin film using a lab-built dual-probe atomic force microscopy (DP-AFM) system. We brought two conducting cantilever tips in contact with a single grain and successfully measured the p-type field-effect characteristics. Moreover, we investigated the effect of contact resistance on the measured characteristics by performing a series of transport measurements while varying tip distance. The contact resistance and hole mobility of the channel region were estimated as 3.1 GΩ and 2.7×10-2 cm2 V-1 s-1, respectively. The results demonstrate the applicability of the DP-AFM system to the nanometer-scale transport measurement of molecules.
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