Investigations of heavy ion tracks in polyethylene naphthalate films

Abstract

The heavy ion beam (with fluence 3 x10 8 ion/cm 2) from a cyclotron has been used for irradiation of thin polyethylene naphthalate (PEN) films. Latent tracks in these polymeric films have been sensitized by UV radiation and then chemically etched in NaOH solution. The etching process parameters have been controlled by the electroconductivity method. After etching, parameters of samples have been examined by SEM and bubble point methods (Coulter® Porometer II instrument). Results have shown good quality of PEN track membranes with pore sizes in the range: 0.1 – 0.5 μm. The described procedure is known for thin polythylene terephthalate (PET) films. Taking into consideration that PEN films have got better mechanical, thermal, gas barrier as well as better chemical resistance properties in comparison with PET films, the possibility of application of such membranes is much wider.