Abstract
AbstractWe present a technique, based on optical polarizing microscopy, and results of direct observation of the optical interference field effect on the transient domains excited by ac electric field in a nematic planar cell with photosensitive aligning layers. The light source used in a microscope operated in DC mode as well as in triggered pulse one. Obtained microscopic snapshots of transient domain structure confirmed our assumption of the transient domains reordering (trapping) by the low intensity optical interference field.
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