Abstract
Electron Backscattered Scattering Detection (EBSD) was used to characterize the texture of La2Zr2O7 (LZO) buffer layers prepared by chemical solution deposition on Ni-5at.% W(Ni5W) biaxially textured substrates. We investigated the texture forming process of LZO films with different cation concentrations of the precursor solution. In this paper, the texture evolution mainly depends on the film thickness and on the grain growth. With low cation concentrations in the precursor solution, the discontinuous LZO grains do not completely cover the Ni5W substrates and exhibit large lattice misorientation with respect to Ni5W (defined as cube orientation). A 45° rotation orientation is found to coexist with the cube orientation and is mainly transformed by the cube orientation with increasing thickness. The interface energy minimization may play a dominant role in texture transformation.
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