Abstract
This study investigated the role of various active species (OH, O, and H2O2) under solution plasma process (SPP) degradation based on the influence of different radical scavengers on the degradation effect and ESR spectra. The structures of oligochitosan with different radical scavengers were characterized by FT-IR, 1H NMR, and XRD analysis. The results indicated that OH, O, and H2O2 played important roles in SPP degradation. The degradation effect of the O was even higher than that of the OH. The physical effects (e.g. UV light and shockwaves) of SPP method or Fenton's reaction might contribute to the degradation treatment. Furthermore, the different scavengers could adjust the degradation effect of the corresponding free radicals. FT-IR, 1H NMR, and XRD analysis revealed that the primary chemical structure of chitosan was not changed by the scavengers. This study found that the controlled degradation by addition of a radical scavenger is feasible. Therefore, this study provided a straightforward analysis of the role of the free radicals and the controlled degradation of chitosan under SPP treatment, which will be beneficial to further develop SPP techniques for chitosan degradation.
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