Abstract
Ce1.2(1-x)Mn1-xSix(x=0.1,0.2.0.3,0.4) NTC thermistor materials were prepared by the traditional solid-state reaction method. The effects of SiO2 content on the microstructure and electric properties of prepared materials are investigated through XRD, SEM, XPS and several instruments for electrical properties characterization. The results indicate that the average grain size increases with the increasing SiO2 content. The resistivity and materials constant B value exhibit opposite change laws. The minimum room resistivity of 7.18×105 Ω·cm and the maximum characteristic parameter B value of 5507K are obtained when x=0.2. And when x=0.1 the aging factor η is 0.34% and it decreases as the CeO2 content increases.
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