Abstract
The current-zero characteristic of vacuum circuit breakers (VCBs) has an important influence on the dynamic dielectric recovery and the success of the breaking test. In the paper, the characteristic of the post-arc current, post-arc charge and the post-arc conductance at current-zero is researched to obtain the influence of the arc memory on the current-zero characteristic and the post-arc characteristic. Based on the synthetic test circuit, the test plat of the current-zero characteristic is set up and the test VCB is a transparency vacuum interrupter in order to observe the development and extinguishing process of the vacuum arc by the high speed CMOS camera. The distribution law of post-arc characteristic is gained by measuring and processing the post-arc current. The relationship between the post arc charge and the final position of last cathode spot is investigated. The current-zero characteristic of VCBs supply the base for controlling vacuum arc, improving the breaking capacity, which maybe also useful to VCBs with multi-break.
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