Investigation on Room Temperature Vulcanized Silicon Insulation With and Without ATH Filler Loading by Incline Plane Tracking & Erosion Test Method

Abstract

Insulation flashovers because of tainting are still a worldwide issue in the power System. In some dirtied areas, up to 33% of all blackout issues are credited to contamination. So strength of the power supply is a first worry in the power System. Robustness in the dielectric materials crosswise over shifting severe conditions is required. Insulator producing has changed over from porcelain and glass protectors to silicon rubber because of its light weight and high mechanical quality and better contaminant opposing execution. Be that as it may, silicon rubber has powerlessness to following and disintegration because of dry band arcing, alongside the qualities like maturing and long haul conduct is obscure. These are the reasons, for which, substitution of the current structure of porcelain coatings in the power System by silicon rubber is troublesome. In this way, Room Temperature Vulcanized (RTV) Silicon coatings is utilized as a part of strong protecting material tending to solutions for these issues. Additionally, resistive properties of RTV covering against contaminant streak over rely on substance structure and filler material. In this way, the present review explores the encasing execution amid following, disintegration and leakage current reviews on RTV Silicon with and without filler stacking examples according to IEC 60587 measures for consistent following voltage. This standard portrays the development of electrical protecting materials utilized under extreme surrounding conditions at power frequencies by estimation of the imperviousness to following and disintegration, utilizing a fluid contaminant and inclined plane examples. For the leakage current estimation, Pico scope interface and a protective circuit were made over the shunt. The leakage current example has been examined with connected voltage for the RTV with and without ATH (Aluminum Tri Hydroxide) filler stacking silicon rubber material. Compound investigation on RTV tests like FTIR, thermal study TGA and morphological study by SEM-EDXA; have been done before and in the wake of following and disintegration test. Comes about and conclusion demonstrates that RTV tests with ATH filler stacking are all the more electrically resistive amid following and disintegration and displays fantastic properties contrasted with RTV tests without ATH filler stacking.