Investigation on quality factor of substrate‐integrated waveguide resonance cavity

Abstract

AbstractAn investigation has been made on the quality factor of substrate‐integrated waveguide (SIW) resonance cavity. The ohmic losses at the sidewalls, front/end walls, and top/bottom planes of the SIW resonance cavity are derived, respectively, resulting in the quality factor formula of the SIW resonance cavity for the first time. The sidewalls and the front/end walls of the SIW resonance cavity are formed by cylinder posts, the discrete integral on the surfaces of the cylinder posts must be considered. The calculated quality factor from this formula at several frequency bands have been obtained, agreeing well with the numerical simulations. The maximum deviations at S‐, X‐ and K‐bands are 1.52%, 1.84%, and 2.98%, respectively, all less than 3%, demonstrating the validity of the proposed quality factor formula for the SIW resonance cavity. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 2007–2010, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22592