Abstract
Abstract In this communication, Y0.95Sr0.05MnO3 (YSMO) thin film having a 300nm thickness, deposited on single crystal Nb:SrTiO3 (SNTO) substrate by pulsed laser deposition (PLD) technique, has been studied for its magnetodielectric and anisotropic properties. XRD measurement was performed for the YSMO/SNTO film which reveals the single phasic nature without any detectable impurity within the measurement range studied. To understand the possible anisotropic magnetodielectric behavior of the presently studied YSMO/SNTO film, frequency (20Hz - 2MHz) dependent dielectric constant was recorded at room temperature under zero field and 1T applied magnetic field dependent dielectric constant was recorded with two aspects: (i) field H parallel to the film's ab plane and (ii) field H perpendicular to the film's ab plane. Variation in the dielectric constant, as well as a magnetodielectric effect with applied magnetic field and field direction, has been discussed in detail.
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