Investigation on ESD EMP damage effects of electronic components

Abstract

5 types of analogue or digital integrated circuits(IC) were selected as devices under test (DUT). The test results have shown that there were different electromagnetic pulse (EMP) sensitivities among different types of ICs. The avaerage damage voltage of operation amplifier was below 5kV The avaerage damage voltage of LF156 caused by EMP was three times higher than that of BG305. For 54 or 74 series of ICs, the average EMP damage voltage was between 8.5∼30kV Because of multi-input or multi-output ends of IC chips, there were several current paths and each path was formed by different devices. Usually three types of end paths were classified such as input-to-ground, output-to-ground and source-to-ground. It had been shown that input or output ends were the sensetivest ones and the source end was the un-sensetivest one. The average EMP damage voltages of 54 or 74 series of ICs were 20∼30kV,15∼20kV and 8.5∼13.5kV when EMP current was injected from suorce, input and output ends respectively.