Abstract
The electronic structure of the MAX-phase Ti2AlC was investigated by soft x-ray emission spectroscopy. This nanolaminated carbide compound represents a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft x-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti L-emission of Ti2AlC, which is not present in the binary TiC system. The spectral shape of Al L-emission in the MAX-phase is strongly modified in comparison to metallic Al. By replacing the constituting elements, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material.
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