Abstract
A photothermal measurements were carried out for a few samples of silicon carbide (SiC). Thickness of the SiC plates was about 1 mm. Samples were highly inhomogeneous and differed in crystal structure. Experimental setup was typical for such investigation. The photothermal signal was measured using mirage detection. Experiment was performed for two configurations: probing beam was running over and under wave propagation in Analysis of experimental data was done according to one dimensional model of thermal wave propagation in multilayer system. Thermal diffusivities and optical absorption coefficients of the samples were determined based on multiparameter fitting procedure.
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