Abstract
Thin films of undoped and gadolinium-doped zinc oxide (Gd-doped ZnO) with different Gd concentration (1-8 at. %) were deposited onto a glass substrate by sol–gel spin-coating technique. X-ray diffraction (XRD, Bruker D8 Advance) studies confirmed the nature of the films as polycrystalline, with typical hexagonal wurtzite structure. The film also showed variation in crystallite size and change in relative intensities, upon different Gd concentrations. Besides, the influence of Gd concentration on the optical transmittance of ZnO films was studied using ultraviolet-visible spectrophotometer (UV-Vis, Shimadzu UV 1800) in the wavelength range 300-800 nm. The optical transmittance of all films is higher than ~95% in the visible region, and doped films become more transparent. The electrical resistance was measured by two point probe (Keithley-2400). The resistance decrease with increasing Gd concentration up to 2 at.% and it increased for further increase Gd concentrations.
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