Abstract
The electrical properties of the ZnSe/GaAs heterostructure have been investigated using the acoustoelectric voltage spectroscopy technique, and in particular, the role of the high-resistivity ZnSe on the surface passivation of the GaAs substrate has been evaluated. From the transverse acoustoelectric voltage (TAV) spectra, the carrier type and concentration, energy band offsets, and the energy levels of various trap states at the heterostructure interface have been found. The effect of heterostructure epitaxial layer on the surface properties of GaAs has been studied by comparing the normalized changes in TAV amplitude for samples of various epitaxial layers and different thicknesses. From all these measurements, surface recombination velocities (S) have been evaluated. For the pseudomorphic ZnSe films (thickness ≤0.15 μm) on GaAs, a reduction in S has been found. As the thickness of the ZnSe film was increased, the presence of a large number of interface states due to the introduction of misfit dislocations was detected using TAV measurements.
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