Abstract
Considered in this work are the possibility and advantages of applying a Ge photodiode to measure the surface plasmon resonance (SPR) in the near infrared range (IR). The investigations were performed using the prototype of IR SPR refractometer that operates with two fixed wavelengths (1310 and 1552 nm) for excitation of surface plasmons in a thin gold film in the Kretschmann optical scheme. The obtained results of experiments enabled us to draw the conclusion that application of the Ge photodiode in the SPR sensor at the wavelength 1.5 µm allows increasing the sensitivity and response magnitude as well as widening the dynamic range of this sensor device.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
