Abstract

The perpendicular exchange bias (Hex) in epitaxial Cu/Ni/FeMn trilayers with various Ni and FeMn thicknesses has been investigated. All the samples were prepared by dc-magnetron sputtering. We analyzed the behaviors of the exchange bias eld and the coercivity as functions of the Ni and the FeMn thicknesses. The maximum perpendicular exchange bias eld (305 Oe) was obtained for Ni(4 nm)/FeMn(5 nm) lms. The exchange bias energy, ex, was calculated in a good argument that exchange bias eld depends on Ni thickness. The crystalline orientation is also reported.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.