Abstract
Measurements of the time derivative of the anodic overpotential of superpurity aluminum during anodic oxidation were made at various constant current densities. The data have been interpreted in terms of the variation of electric field strength with position in the oxide film. The analytic form of the profile of the electric field strength in the oxide film was deduced, assuming the high field Frenkel defect model. The data were found to be incompatible with the theoretical profile, providing, therefore, evidence against this model. The data are only consistent with a model for the transport process in which the concentration of ionic current carriers at a position in the oxide remote from the metal interface is independent of the field strength. A new model, proposed recently by Dignam to explain transient ionic conduction phenomena, is consistent with this conclusion.
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