Investigation of the IC resistance to pulsed electromagnetic radiation

Abstract

The results of the experimental investigation of the resistance of digital ICs to electromagnetic radiation, whose parameters are varied in a rather large range (at the wavelength λ= 4 cm, RF pulse duration τ = 0.1−1000 μs and pulse-repetition frequency F = 0.1−10000 Hz), are presented. The damage to the ICs caused by the radiations is analyzed. The experiment conditions are compared to the actual irradiation conditions for the ICs mounted on an electronic-equipment printed circuit board.