Abstract
The first stages of the growth of highly strained ZnTe on (001) CdTe are investigated by reflection high energy electron diffraction, HRTEM (high resolution transmission electron microscopy), x-ray photoelectron spectroscopy, and x-ray double diffraction. A precise study of the factors influencing the critical thickness is presented, with emphasis on the effect of Zn pre-exposure of the CdTe surface on the subsequent ZnTe growth. Below the critical thickness small lattice distortions attributed to a nontetragonal elastic distortion are detected. An exposure of the (001)CdTe surface to a Zn flux leads to the desorption of the Cd atoms present on the top of the surface and to the formation of a c(2×2) reconstructed surface with half a monolayer of Zn on the top of the surface. Finally, the morphology of an ultrathin strained ZnTe layer embedded in a (001)CdTe matrix will be discussed using results obtained from analysis of the digitized HRTEM image.
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