Abstract

Glass frits were added into silicone-based composites with the aim to improve low temperature ceramification at elevated temperatures. The effect of glass frits on the properties of ceramic residue is investigated. Field emission scanning electron microscopy (FESEM), electron probe microchemical analysis (EPMA) and X-ray diffraction analysis (XRD) showed that glass frits reacted via a eutectic reaction with mica and silica. Electrical conductivity measurements at elevated temperatures showed a decline in volume resistivity with glass frit addition. It was concluded that increased conductivity is a result of ionic conduction of the glass phase produced by eutectic reactions between frits, silica and mica at high temperatures. Thermal mechanical analysis (TMA) was used to explore the dimensional changes of these composites during programmed heat treatment.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.