Abstract
AbstractSecondary electron emission measurements performed in a conventional UHV LEED/Auger chamber are used to investigate the band structural characteristics of type IA diamond. The Auger spectrum obtained reflects structure in the valence band and compliments the techniques of X‐ray photoemission spectroscopy and soft X‐ray emission. Characteristic loss spectra reveals greater detail than hitherto and confirms some of the earlier optical measurements. K‐shell ionisation spectra confirms theoretical predictions of two conduction bands in diamond separated by a well defined energy gap, and reveals the structure associated with these bands. Low‐energy secondary emission resulting from interband transitions, and stimulated by incident electrons of energy below the K‐shell ionization energy, is observed to correlate with band structure calculations, and also confirms the presence of an energy gap separating two conduction bands. In addition, it provides a means for investigating the energy eigenvalues at various k‐points within an elementary region of the Brillouin zone.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
